Method to Estimate Surface Gloss
AssigneeDatacolor Inc.
InventorsZhiling Xu, Bill Binder, Venkata R. Thumu
Life of this patent
Estimating the term…
Abstract
As described herein, a method has been developed to estimate the gloss of a black or dark sample using a color measurement system. In such a system, when measuring a higher gloss sample, more illumination light reflected from the sample surface will be directed away from the receiving sensor, and thus less signal will be detected. Using a derived sensor-signal to surface-gloss relationship, the surface gloss of a sample can be calculated by applying the measurements of the sample to the signal to gloss relationship to obtain a more accurate gloss measurement of a sample under analysis.
Claims18
A method of determining the gloss properties of a sample, the method comprising the steps of:
- measuring, using a light measurement device, light emitted by an illuminant and reflected off of the sample to obtain one or more raw measurement values;
- accessing, using one or more processors configured to execute code, a gloss model, wherein the gloss model is configured to accept the one or more raw measurement values as input values to the gloss model and output a corresponding gloss value;
- applying, using one of the one or more processors, the one or more raw measurement values as an input to the gloss model;
- receiving, using one of the one or more processors, as an output from the gloss model, a gloss value that corresponds to the at least the one or more raw measurement values;
- outputting, using one or more processors, the gloss value to one or more output devices.
A method of generating a raw measurement gloss model, the method comprising the steps of:
- measuring, using a light measurement device, light emitted by an illuminant and reflected off of one of a plurality of samples, where the one of the plurality of samples is formed of a first material to obtain a first measurement value;
- associating with the first measurement value a corresponding gloss value for the first material;
- measuring, using the light measurement device, light emitted by the illuminant and reflected off of at least one other sample of a plurality of samples, where the at least one other of the plurality of samples is formed of a second material different from the first material, to obtain a second measurement value;
- associating with the at least one other of the plurality of samples a corresponding gloss value for the second material;
- generating, using at least the first measurement value and gloss value and the second measurement value and gloss value, a gloss model configured to receive an input of a measurement value and generate a corresponding output of a gloss value.
The method of 12, wherein the measurement values are color values.
The method of 16, wherein the color values are tristimulus values (X,Y,Z) or L* values (L*,a*,b*).
The method of 17, wherein each of the plurality of samples is substantially black in color.
Dependencies are inferred from the claim text.