Analysis Device and Analysis Method

An analysis apparatus comprising:

• a setting device configured to set information on a structure of an optical connection structure;
• a solution device configured to solve a partial differential equation having, as an unknown, an electromagnetic field distributed in the optical connection structure based on the information on the structure of the optical connection structure to determine a distribution of the electromagnetic field;
• a data extraction device configured to extract, from the distribution of the electromagnetic field determined by the solution device, a mode distribution in a plane at a predetermined position of the optical connection structure and a time response of an electromagnetic field at a predetermined position of the optical connection structure;
• and
• a characteristics analysis device configured to analyze optical characteristics of the optical connection structure based on the mode distribution and the time response of the electromagnetic field extracted by the data extraction device.

An analysis method comprising:

• setting information on a structure of an optical connection structure;
• solving a partial differential equation having, as an unknown, an electromagnetic field distributed in the optical connection structure based on the information on the structure of the optical connection structure to determine a distribution of the electromagnetic field;
• obtaining, from the distribution of the electromagnetic field, a mode distribution in a plane at a predetermined position of the optical connection structure and a time response of an electromagnetic field at a predetermined position of the optical connection structure;
• and
• analyzing optical characteristics of the optical connection structure based on the mode distribution and the time response of the electromagnetic field.