Semiconductor storage device, method of controlling semiconductor storage device, and memory system
AssigneeKioxia Corporation
InventorsKeisuke TERADA, Eietsu TAKAHASHI
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Abstract
A semiconductor storage device includes a memory cell and a control circuit configured to, upon receipt of a command, acquire a first temperature measured by a temperature sensor, and perform an operation corresponding to the command using a parameter corrected based on temperature. When the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature. When the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.
Claims20
A semiconductor storage device, comprising:
- a memory cell;
- and
- a control circuit configured to:
- acquire a first temperature measured by a temperature sensor upon receipt of a command;
- and
- perform an operation corresponding to the command using a parameter corrected based on a temperature measured by the temperature sensor, wherein
- when the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature, and
- when the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.
A method of controlling a semiconductor storage device, the method comprising:
- acquiring a first temperature measured by a temperature sensor upon receipt of a command;
- and
- performing an operation corresponding to the received command using a parameter corrected for temperature, wherein
- when the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature, and
- when the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.
A memory system, comprising:
- a controller configured to issue a command;
- and
- a semiconductor storage device including:
- a memory cell, and
- a control circuit configured to:
- acquire a first temperature measured by a temperature sensor upon receipt of the command from the controller;
- and
- perform an operation corresponding to the command using a parameter corrected based on temperature, wherein
- when the first temperature is within a predetermined range with respect to a second temperature measured before the command is received, the parameter is corrected using the second temperature, and
- when the first temperature is outside the predetermined range, the parameter is corrected using the first temperature.
Dependencies are inferred from the claim text.