Spectroscopic analysis device, optical system, and method
AssigneeYokogawa Electric Corporation
InventorsKodai Murayama, Toshiyuki Saruya, Fumie Watanabe, Risa Hara
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Abstract
A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.
Claims10
A spectroscopic analysis device, comprising:
- a film that contacts a sample subject to spectroscopic analysis;
- a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film;
- and
- an optical waveguide that transmits the first irradiation light irradiated from the first irradiator, wherein
- a first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.
An optical system, comprising:
- a film that contacts a sample subject to spectroscopic analysis;
- an optical waveguide that transmits first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film, wherein a first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material;
- and
- a prism disposed on a side opposite the film with respect to the optical waveguide, wherein the prism allows a second irradiation light to pass through, and
- the second irradiation light generates a second evanescent wave projected onto a region of the sample and absorbed into the sample.
A method, comprising:
- irradiating, with an irradiator, a first irradiation light having transition energy to decompose attached material attached to a boundary surface of a film, wherein the film is a film that contacts a sample subject to spectroscopic analysis;
- transmitting, to an optical waveguide, the irradiated first irradiation light;
- generating a first evanescent wave on a front surface of the optical waveguide, wherein the first evanescent wave is based on the first irradiation light;
- and
- projecting the first evanescent on an attached region of the attached material.
Dependencies are inferred from the claim text.