Photon counting and multi-spot spectroscopy
AssigneeCaptl LLC
InventorsMasanobu Yamamoto, J. Paul Robinson, Keegan Hernandez
Life of this patent
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Abstract
An example system can include a support and two or more sensor elements mounted to the support. Each sensor element can be electrically connected to a common electrical node and may include: a respective quench resistor connected to a respective internal node; and a respective photodiode (PD) connected to the respective internal node; a differentiating element fed by at least one of the photodiodes; a first readout electrode fed by the common electrical node; and a second readout electrode fed by the differentiating element. The common electrical node may be connected to at least one of the quench resistors or at least one of the photodiodes.
Claims30
1-42. (canceled)
A silicon photomultiplier (SiPM) system, comprising:
- an SiPM array, comprising:
- a plurality of photosensors, each photosensor including a quench resistor coupled in series with a Geiger-mode avalanche photodiode (APD),
- a first electrode configured to provide an output signal of the SiPM array, the output signal comprising an amalgamation of the plurality of APD signals;
- a second electrode configured to provide a biasing voltage to each of the plurality of photosensors;
- a differentiator coupled to the first electrode and configured to differentiate the output signal of the SiPM array, the differentiator configured to generate a differentiated signal from the output signal;
- and
- a pule counting circuit coupled to the differentiator and configured to generate pulses associated with the differentiated signal.
A particle detection optical system, comprising:
- at least two narrow-band illumination sources, the at least two narrow-band illumination sources comprising a first source and a second source configured to provide respective beams;
- a flow chamber;
- an optical arrangement, wherein the optical arrangement is configured to direct respective beams from each of the at least two narrow-band illumination sources through respective spaced-apart locations disposed along a longitudinal axis of the flow chamber, wherein the optical arrangement is further configured to direct a first beam from a first source of the at least two narrow-band illumination sources along an illumination axis;
- an optical sensor configured to provide an output signal associated with the first beam, the optical sensor arranged substantially on the illumination axis and optically positioned after the flow chamber;
- and
- a controller configured to:
- operate the first source of the at least two narrow-band illumination sources,
- establish a baseline associated with the output signal,
- detect a variation as compared to the baseline in the output signal at a first time, and
- enable the second source of the at least two narrow-band illumination sources at a second time, the second time being substantially a predetermined time interval after the first time.
The particle detection optical system according to 53, wherein the respective spaced-apart location associated with the second source of the at least two narrow-band illumination sources is downstream of the location associated with the first source of the at least two narrow-band illumination sources along the flow direction.
The particle detection optical system according to 54, wherein the predetermined time interval substantially corresponds to amount of time required for a sample to move at the flow rate from the spaced-apart location associated with the first source of the at least two narrow-band illumination sources and the spaced-apart location associated with the second source of the at least two narrow-band illumination sources.
A particle detection optical system, comprising:
- at least two narrow-band illumination sources, the at least two narrow-band illumination sources comprising a first source and a second source configured to provide respective beams;
- a flow chamber;
- an optical arrangement, wherein the optical arrangement is configured to direct respective beams from each of the at least two narrow-band illumination sources through respective spaced-apart locations disposed along a longitudinal axis of the flow chamber, wherein the optical arrangement is further configured to direct a first beam from a first source of the at least two narrow-band illumination sources along an illumination axis;
- an optical sensor configured to provide an output signal associated with the first beam, the optical sensor arranged substantially on the illumination axis and optically positioned after the flow chamber;
- and
- a controller configured to:
- operate the first source of the at least two narrow-band illumination sources,
- establish a baseline associated with the output signal,
- detect a variation as compared to the baseline in the output signal at a first time, and
- enable the second source of the at least two narrow-band illumination sources at a second time, the second time being substantially a predetermined time interval after the first time;
- the optical sensor includes a silicon photomultiplier (SiPM) array, comprising:
- a plurality of photosensors, each photosensor including a quench resistor coupled in series with a Geiger-mode avalanche photodiode (APD),
- a first electrode configured to provide an output signal of the SiPM array, the output signal comprising an amalgamation of the plurality of APD signals,
- a second electrode configured to provide a biasing voltage to each of the plurality of photosensors,
- a differentiator coupled to the first electrode and configured to differentiate the output signal of the SiPM array, the differentiator configured to generate a differentiated signal from the output signal, and
- a pule counting circuit coupled to the differentiator and configured to generate pulses associated with the differentiated signal.
The particle detection optical system according to 67, wherein the respective spaced-apart location associated with the second source of the at least two narrow-band illumination sources is downstream of the location associated with the first source of the at least two narrow-band illumination sources along the flow direction.
The particle detection optical system according to 68, wherein the predetermined time interval substantially corresponds to amount of time required for a sample to move at the flow rate from the spaced-apart location associated with the first source of the at least two narrow-band illumination sources and the spaced-apart location associated with the second source of the at least two narrow-band illumination sources.
Dependencies are inferred from the claim text.