Multi-lane optical-electrical device testing using automated testing equipment

A method for testing of an optical-electrical device under test (DUT) using an automated testing equipment (ATE) system, the method comprising:

• configuring an optical test lane switch selector in a first configuration for optical testing of a first lane of the optical-electrical DUT, the optical-electrical DUT being a multilane optical transceiver comprising a plurality of transceiver lanes including the first lane and a second lane, each lane of the plurality of transceiver lanes modulating light using an optical transmitter for the lane and receiving light using an optical receiver for the lane, the optical test lane switch selector being configured for the first configuration by selecting, using an optical switch in the optical test lane switch selector, one of a plurality of output fibers coupled to the optical-electrical DUT to a testing fiber that is coupled to an optical testing device, the optical test lane switch selector being further configured in the first configuration by activating an external light source in the optical test lane switch selector to transmit light to the optical-electrical DUT on one of a plurality of input fibers that are coupled to the optical-electrical DUT the one of the plurality of output fibers and the one of the plurality of input fibers corresponding to the first lane of the multilane optical transceiver;
• calibrating one or more optical components of the first lane of the optical-electrical DUT while the optical test lane switch selector is in the first configuration, the one or more optical components calibrated according to data generated by the optical testing device using the light coupled into the testing fiber by the optical switch in the first configuration;
• configuring the optical test lane switch selector in a second configuration for optical testing of a second lane of the optical-electrical DUT, wherein the second lane is another lane of the plurality of transceiver lanes, the optical test lane switch selector being configured for the second configuration by selecting, using the optical switch in the optical test lane switch selector, another of the plurality of output fibers coupled to the optical-electrical DUT to the testing fiber that is coupled to the optical testing device, the optical test lane switch selector being further configured in the second configuration by activating the external light source of the optical test lane switch selector to transmit light to the optical-electrical DUT on another of the plurality of input fibers that are coupled to the optical-electrical DUT, the another of the plurality of output fibers and the another of the plurality of input fibers corresponding to the second lane of the multilane optical transceiver;
• and
• calibrating one or more optical components of the second lane of the optical-electrical DUT while the optical test lane switch selector is in the second configuration, the one or more optical components calibrated according to additional data generated by the optical testing device using the light that is coupled to the testing fiber by the optical test lane switch selector in the second configuration.