Acoustic wave device and multiplexer
AssigneeMurata Manufacturing Co., Ltd.
InventorsHideki IWAMOTO, Akira MICHIGAMI, Tsutomu TAKAI, Takeshi NAKAO
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AssigneeMurata Manufacturing Co., Ltd.
InventorsHideki IWAMOTO, Akira MICHIGAMI, Tsutomu TAKAI, Takeshi NAKAO
Estimating the term…
An acoustic wave device includes a support substrate including silicon, a piezoelectric layer in which a rotated Y-cut X-propagation lithium tantalate is included, and an IDT electrode. A film thickness of the piezoelectric layer is less than or equal to about 1λ. When α111 is an angle between a directional vector k111, and a direction of silicon and n is an arbitrary integer, the angle α111 is in a range of about 0°+120°×n≤α111≤45°+120°×n or in a range of about 75°+120°×n≤α111≤120°+120°×n when the IDT electrode is on a positive surface of the piezoelectric layer and the angle α111 is in a range of about 15°+120°×n≤α111≤105°+120°×n when the IDT electrode is on the negative surface of the piezoelectric layer.
An acoustic wave device comprising:
An acoustic wave device comprising:
An acoustic wave device comprising:
Dependencies are inferred from the claim text.