Precision reconstruction for panel-level packaging
AssigneePyxis Cf Pte. Ltd.
InventorsAmlan Sen, Chian Soon Chua, QING FENG GUAN, WAI HOE LEE
Life of this patent
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AssigneePyxis Cf Pte. Ltd.
InventorsAmlan Sen, Chian Soon Chua, QING FENG GUAN, WAI HOE LEE
Estimating the term…
Panel level packaging (PLP) with high positional accuracy of dies. The PLP bonds dies accurately to die bonding regions of an alignment panel. High accuracy is achieved by providing die bonding regions with local alignment marks. Accurate die bonding on the alignment carrier results in a reconstructed wafer with accurate positioning of dies. The dies of the reconstructed wafer can be scanned by a die location check (DLC) scan based on sub-blocks of dies, enabling high DLC throughput. The DLC scan generates a DLC file with coordinate points of sub-blocks of the reconstructed wafer. Also, a laser direct imaging (LDI) file can be generated using sub-block circuit files aligned to the DLC file. The use of sub-block circuit files facilitates high throughput in generating the LDI file with high accuracy due to the reconstructed wafer being formed using the alignment carrier with local alignment marks.
A method for a die location check (DLC) comprising:
A method of bonding dies for panel level processing comprising
Dependencies are inferred from the claim text.