Method and device for processing data stored in a memory unit

A method for processing data stored in a memory unit, comprising the following steps:

• ascertaining a randomly or pseudo-randomly formed test pattern, which characterizes at least one first subarea of a memory area of the memory unit;
• and
• forming, as a function of the test pattern, a test variable associated with data stored in the at least one first subarea.

The method as recited in 24, wherein a) all subareas of the memory area have the same length, or b) at least some of the subareas of the memory area have a different length.

A device for processing data stored in a memory unit, the device configured to:

• ascertain a randomly or pseudo-randomly formed test pattern which characterizes the at least one first subarea of a memory area of the memory unit;
• and
• form, as a function of the test parameter a test variable associated with data stored in the at least one first subarea.

A method for forming a test pattern, which characterizes at least one first subarea of a memory area of a memory unit for storing data, the method comprising:

• randomly or pseudo-randomly forming the test pattern.