Circuits for power down leakage reduction in random-access memory
AssigneeSamsung Electronics Co., Ltd.
InventorsAnkur GUPTA, Manish Chandra JOSHI, Parvinder Kumar RANA
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AssigneeSamsung Electronics Co., Ltd.
InventorsAnkur GUPTA, Manish Chandra JOSHI, Parvinder Kumar RANA
Estimating the term…
The present invention discloses a wordline driver circuit for a random-access memory (RAM), which can reduce leakage during power down mode. The circuit includes a pre-driver stage on header and footer. The pre-driver stage includes a strap buffer defining a header and comprising a first switch connecting a first set of wordlines to a first voltage. The pre-driver stage includes an input-output buffer defining a footer and comprising a second switch connecting a second set of wordlines to a second voltage. In the pre-driver stage, the strap buffer further includes a third switch connecting the second set of wordlines to the first voltage and a fourth switch connecting the first set of wordlines to the second voltage.
A wordline driver circuit for a random-access memory (RAM) configured to reduce leakage during a power down mode, the wordline driver circuit comprising:
A method of reducing leakage during a power down mode in a wordline driver circuit of a random-access memory (RAM), the method comprising:
A wordline driver circuit for a random-access memory (RAM), the wordline driver circuit comprising:
Dependencies are inferred from the claim text.