Defect detection method, computer device and storage medium
AssigneeHon Hai Precision Industry Co., Ltd.
InventorsWAN-JHEN LEE, TUNG-TSO TSAI, CHIN-PIN KUO, TZU-CHEN LIN, GUO-CHIN SUN
Life of this patent
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Abstract
A product defect detection method which includes acquiring a detection image of a product to be detected is provided. The method further includes dividing the detection image into a first preset number of detection blocks. Once a detection result of each detection block is obtained by inputting each detection block into a preset defect recognition model, according to a position of each detection block in the detection image, a detection result of the product is determined according to the detection result of each detection block.
Claims20
A product defect detection method applied to a computer device, the method comprising:
- acquiring a detection image of a product;
- dividing the detection image into a first preset number of detection blocks;
- obtaining a detection result of each detection block by inputting each detection block into a preset defect recognition model, according to a position of each detection block in the detection image;
- and
- determining a detection result of the product according to the detection result of each detection block.
A computer device comprising:
- a storage device;
- at least one processor;
- and
- the storage device storing one or more programs, which when executed by the at least one processor, cause the at least one processor to:
- acquire a detection image of a product;
- divide the detection image into a first preset number of detection blocks;
- obtain a detection result of each detection block by inputting each detection block into a preset defect recognition model, according to a position of each detection block in the detection image;
- and
- determine a detection result of the product according to the detection result of each detection block.
A non-transitory storage medium having instructions stored thereon, when the instructions are executed by:
- a processor of a computer device, the processor is configured to perform a product defect detection method, wherein the method comprises:
- acquiring a detection image of a product;
- dividing the detection image into a first preset number of detection blocks;
- obtaining a detection result of each detection block by inputting each detection block into a preset defect recognition model, according to a position of each detection block in the detection image;
- and
- determining a detection result of the product according to the detection result of each detection block.
Dependencies are inferred from the claim text.