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AssigneeSiemens Aktiengesellschaft
InventorsAthina Liatsa, Thomas Mittermeier, Henning Ochsenfeld, Liam Pettigrew
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The disclosure relates to a method and a device for producing a product and to a computer program product. The product is produced in at least one production step. A quality control check is optionally carried out after at least one of the production steps to determine a quality index of the product in question. To save on the quality control check, a quality indicator of the product in question is determined using production data. The production data are advantageously provided by sensors. The quality indicator of the product in question may be calculated using an adaptive algorithm. The adaptive algorithm may be taught and/or improved using quality indices of a quality control unit and the corresponding production data. The adaptive algorithm may be taught with the aid of a further computing unit, in particular in a cloud.
A method comprising:
The method of claim I, wherein, with aid of a conversion module, production data from a plurality of different sensors is convertible to a common data type.
A computer program product for execution on a computing unit, wherein the computing unit is configured to:
An apparatus for producing a circuit board, the apparatus comprising:
Dependencies are inferred from the claim text.