Debug probe for measuring at least one property of a target system
AssigneeArm Limited
InventorChristopher James Styles
Life of this patent
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Abstract
A debug probe (102) for controlling debugging of a target system (104) is described, the debug probe comprising an interface (128) comprising a plurality of pins (202), debug control circuitry (130) to control debugging of the target system based on a digitally sampled level of at least one signal communicated through at least one of the plurality of pins, and measurement circuitry (204) to make a measurement of a property of the target system based on an analogue level of a signal received through said at least one of the plurality of pins.
Claims19
A debug probe for controlling debugging of a target system, the debug probe comprising:
- an interface comprising a plurality of pins;
- debug control circuitry to control debugging of the target system based on a digitally sampled level of at least one signal communicated through at least one of the plurality of pins;
- and
- measurement circuitry to make a measurement of a property of the target system based on an analogue level of a signal received through said at least one of the plurality of pins.
A method of measuring at least one property of a target system using a debug probe comprising an interface comprising a plurality of pins, the method comprising:
- controlling debugging of the target system based on a digitally sampled level of at least one signal communicated through at least one of the plurality of pins;
- and
- making a measurement of a property of the target system based on an analogue level of a signal received through said at least one of the plurality of pins.
Dependencies are inferred from the claim text.