Electronic component handling apparatus and electronic component testing apparatus
AssigneeAdvantest Corporation
InventorsYoshinori Arai, Yoshitaka Takeuchi, Hiroyuki Kikuchi
Life of this patent
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Abstract
An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another. The socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester. At least one of the contact units is removably disposed on the electronic component handling apparatus.
Claims20
An electronic component handling apparatus that handles a device under test (DUT), the electronic component handling apparatus comprising:
- contact units that adjust a temperature of the DUT independently from one another and press the DUT against a socket independently from one another, wherein
- the socket is disposed on a test head that is mounted to each of the contact units and that is connected to a tester, and
- at least one of the contact units is removably disposed on the electronic component handling apparatus.
Dependencies are inferred from the claim text.