Analysis device and image generation method

An analysis device for analyzing results of inspection of an inspection object, comprises:

• a display part configured to display an image;
• and
• an image generation part configured to generate an image to be displayed on the display part, and
• wherein the inspection object includes a plurality of inspection target devices formed thereon, the inspection target devices having respective electrodes on which needle marks are formed by being brought into contact with probes during an electrical inspection,
• wherein the image generation part is configured to generate an analysis image based on information pertaining to inspection results with respect to the needle marks,
• wherein the analysis image comprises:
• a needle mark scatter plot image showing positions of the needle marks with respect to the electrodes in each of the plurality of inspection target devices in an overlapped manner;
• an inspection object map image which is an image showing a surface of the inspection object having the plurality of inspection target devices formed thereon, the inspection target device map image showing needle mark inspection results with respect to the plurality of inspection target devices at positions corresponding respectively to the plurality of inspection target devices;
• and
• a captured image of the electrodes, and
• wherein display contents of the needle mark scatter plot image, the inspection object map image, and the captured image are linked with each other.