Axially-Offset Differential Interference Contrast Correlation Spectroscopy
AssigneePurdue Research Foundation
InventorsGarth Jason Simpson, Chen Li, Changqin Li
Life of this patent
Estimating the term…
Loading patent…
AssigneePurdue Research Foundation
InventorsGarth Jason Simpson, Chen Li, Changqin Li
Estimating the term…
A method of obtaining a measurement signal representative of the particle size distributions in nanocrystal suspensions that includes a step of providing a first light beam along a first axis to a first micro-retarder array to generate polarization wavefront shaped light. The shaped light is applied to an objective configured to focus two orthogonally polarized components of the polarization wavefront shaped light to produce first and second axially offset foci along the first axis. A sample having particles in suspension is disposed in one foci to produce a measurement optical signal having phase and intensity values corresponding to at least some of the particles in suspension. The method also includes determining intensity and quantitative phase information as a function of time based on the optical signals.
A method of obtaining intensity and quantitative phase information representative of the particle size distributions in nanocrystal suspensions, comprising:
A method of obtaining intensity information representative of the particle size distributions in nanocrystal suspensions, comprising:
Dependencies are inferred from the claim text.