Linear temperature calibration compensation for spectrometer systems

A system comprising:

• a light source;
• an interferometer;
• a detector;
• and
• an electronic control device,
• wherein the light source is operable to emit light towards a sample region,
• wherein the interferometer is operable to:
• receive sample light that is at least one of light reflected by or transmitted through an object in the sample region, the sample light having a first range of wavelengths, and
• transmit, from the interferometer to the detector, a subset of the sample light, the subset of the sample light having a second range of wavelengths, the second range of wavelengths being a subset of the first range of wavelengths, wherein transmitting the subset of the sample light comprises:
• determining a reference voltage corresponding to the second range of wavelengths and a reference temperature,
• determining, using a temperature sensor, a temperature of an environment of the spectrometer,
• determining a bias voltage corresponding to a difference between the reference temperature and the temperature of the environment of the spectrometer, and
• applying, to the interferometer, an input voltage corresponding to the sum of the reference voltage and the bias voltage,
• wherein the detector is operable to measure the subset of the sample light, and
• wherein the electronic control device is operable to determine a spectral distribution of light corresponding to the object based on the measured subset of the sample light.