High performance nanosheet fabrication method with enhanced high mobility channel elements
AssigneeTokyo Electron Limited
InventorsMark I. Gardner, H. Jim Fulford
Life of this patent
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AssigneeTokyo Electron Limited
InventorsMark I. Gardner, H. Jim Fulford
Estimating the term…
In a method for forming a semiconductor device, an epitaxial layer stack is formed over a substrate. The epitaxial layer stack includes intermediate layers, one or more first nano layers with a first bandgap value and one or more second nano layers with a second bandgap value. Trenches are formed in the epitaxial layer stack to separate the epitaxial layer stack into sub-stacks such that the one or more first nano layers are separated into first nano-channels, and the one or more second nano layers are separated into second nano-channels. The intermediate layers are recessed so that the first nano-channels and the second nano-channels in each of the sub-stacks protrude from sidewalls of the intermediate layers. Top source/drain (S/D) regions are formed in the trenches and in direct contact with the first nano-channels. Bottom source/drain (S/D) regions are formed in the trenches and in direct contact with the second nano-channels.
A method of forming a semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.