Methods and apparatus for controlling ion fraction in physical vapor deposition processes
AssigneeApplied Materials, Inc.
InventorsXiaodong WANG, Joung Joo LEE, Fuhong ZHANG, Martin Lee RIKER, Keith A. MILLER, William FRUCHTERMAN, Rongjun WANG, Adolph Miller ALLEN, Shouyin ZHANG, Xianmin TANG
Life of this patent
Estimating the term…