Plasma processing apparatus and plasma processing method
AssigneeTokyo Electron Limited
InventorChishio KOSHIMIZU
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AssigneeTokyo Electron Limited
InventorChishio KOSHIMIZU
Estimating the term…
A disclosed plasma processing apparatus includes a chamber, a substrate support, a plasma generator, and first and second power sources. The first power source is configured to generate an electric bias and electrically connected to a lower electrode of the substrate support provided in the chamber. The second power source is configured to apply a positive voltage to a member in a first period that is a part of a whole period in which the electric bias output from the first power source to the lower electrode has a potential not less than an average potential of the electric bias within a cycle thereof. The member is disposed to be exposed to plasma generated in the chamber. The first power source is configured to output the electric bias having a positive potential to the lower electrode in a second period after the first period.
A plasma processing apparatus comprising:
A plasma processing method comprising:
Dependencies are inferred from the claim text.