Test and measurement instrument accessory with reconfigurable processing component
AssigneeTektronix, Inc.
InventorsCharles W. Case, Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett, Julie A. Campbell
Life of this patent
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AssigneeTektronix, Inc.
InventorsCharles W. Case, Daniel G. Knierim, Joshua J. O'Brien, Josiah A. Bartlett, Julie A. Campbell
Estimating the term…
A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
A test system, comprising:
Dependencies are inferred from the claim text.