Test system and method for signal processing
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsKevin GUO, Johann TOST
Life of this patent
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Abstract
The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.
Claims19
A test system, comprising:
- a test instrument, wherein the test instrument comprises:
- an input port configured to acquire a test signal,
- a display configured to display a graphical representation of the test signal, and
- an application interface configured to forward the test signal;
- and
- a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises:
- a processing unit configured to further process the received test signal, and
- an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.
A method for signal processing, comprising:
- acquiring a test signal with a test instrument;
- displaying a graphical representation of the test signal;
- forwarding the test signal to a test application module;
- further processing the received test signal with the test application module, and forwarding a result of the further processing back to the test instrument or to a further device.
Dependencies are inferred from the claim text.