Probe card device and fence-like probe thereof
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, Hsun-Tai Wei, KAI-CHIEH HSIEH, WEI-JHIH SU
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AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWEN-TSUNG LEE, Hsun-Tai Wei, KAI-CHIEH HSIEH, WEI-JHIH SU
Estimating the term…
A probe card device and a fence-like probe thereof are provided. The fence-like probe includes a stroke segment, a fan-out segment, and a testing segment. The stroke segment is in an elongated shape defining a longitudinal direction, and the stroke segment has two end portions and a plurality of penetrating slots that are arranged along a fan-out direction perpendicular to the longitudinal direction, so that the stroke segment is deformable to store an elastic force by being applied with a force. The fan-out segment and the testing segment are respectively connected to the two end portions of the stroke segment. The fan-out segment has a fixing point arranged away from the stroke segment, and the testing segment has an abutting point arranged away from the stroke segment. Along the fan-out direction, the fixing point is spaced apart from the abutting point by a fan-out distance.
A probe card device, comprising:
(canceled)
A fence-like probe of a probe card device, comprising:
Dependencies are inferred from the claim text.