Measuring system, measuring method, and measuring program
AssigneeThe University of Tokyo
InventorsMasahiro HIRANO, Taku SENOO, Norimasa KISHI, Masatoshi ISHIKAWA
Life of this patent
Estimating the term…
Loading patent…
AssigneeThe University of Tokyo
InventorsMasahiro HIRANO, Taku SENOO, Norimasa KISHI, Masatoshi ISHIKAWA
Estimating the term…
A measuring system configured to measure a position of an object is provided with an imaging apparatus and an information processing apparatus, wherein: the imaging apparatus is a camera having a frame rate of 100 fps or higher, and is configured to image the object included in the angle of view of the camera, as an image; the information processing apparatus is provided with a communication unit, an IPM conversion unit, and a position measuring unit; the communication unit is connected to the imaging apparatus, and is configured to receive the image captured by the imaging apparatus; the IPM conversion unit is configured to set at least a part of the image including the object as a predetermined area, and to perform an inverse perspective projection transportation of the image to generate an IPM image limited to the predetermined area. Here, the IPM image is an image in which a predetermined area including the object is rendered as seen from overhead; and the position measuring unit is configured to measure the position of the object on the basis of the IPM image.
A measurement system configured to measure a position of an object, comprising:
A measurement method for measuring position of an object, comprising:
An information processing apparatus of a measurement system configured to measure position of an object, comprising:
Dependencies are inferred from the claim text.