3d nand memory device and method of forming the same
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsZhongwang SUN, Zhong ZHANG, Wenxi ZHOU, Zhiliang XIA
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsZhongwang SUN, Zhong ZHANG, Wenxi ZHOU, Zhiliang XIA
Estimating the term…
In a method for fabricating a semiconductor device, an initial stack of sacrificial word line layers and insulating layers is formed over a substrate of the semiconductor device. The sacrificial word line layers and the insulating layers are disposed over the substrate alternately. A first staircase is formed in a first staircase region of a connection region of the initial stack. A second staircase is formed in a second staircase region of the connection region of the initial stack. The connection region of the initial stack includes a separation region between the first and second staircases, and the connection region is positioned between array regions of the initial stack at opposing sides of the initial stack.
A method for fabricating a semiconductor device, comprising:
A method for fabricating a semiconductor device, comprising:
Dependencies are inferred from the claim text.