Fourier Transform Electrostatic Linear Ion Trap and Reflectron Time-of-Flight Mass Spectrometer
AssigneeDH Technologies Development Pte. Ltd.
InventorEric Thomas Dziekonski
Life of this patent
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AssigneeDH Technologies Development Pte. Ltd.
InventorEric Thomas Dziekonski
Estimating the term…
An MCP detector (620) receives an ion packet along an ion path (601) of mass spectrometer through a hollow central cylindrical tube (621) of the MCP detector. The MCP detector includes coaxial rings (622) of MCPs surrounding the hollow central cylindrical tube. The MCP detector transmits the ion packet along the ion path to an ELIT (610) through holes in the center of a first set of reflectron plates (613) of the ELIT to oscillate the ion packet between the first set and a second set of reflectron plates (614) of the ELIT. The ELIT transmits the oscillated ion packet back to the MCP detector along the ion path through the holes of the first set. The MCP detector detects ions of the oscillated ion packet that are radially deflected from the ion path using the rings of MCPs. The MCP detector allows ions to be transmitted to or from either port of the ELIT.
A system for detecting ions from an electrostatic linear ion trap (ELIT) using a microchannel plate (MCP) detector that does not physically obstruct an ion path of a mass spectrometer, comprising:
A method for detecting ions from an electrostatic linear ion trap (ELIT) using a microchannel plate (MCP) detector that does not physically obstruct an ion path of a mass spectrometer, comprising:
A computer program product, comprising a non-transitory and tangible computer-readable storage medium whose contents include a program with instructions being executed on a processor to perform a method for detecting ions from an electrostatic linear ion trap (ELIT) using a microchannel plate (MCP) detector that does not physically obstruct an ion path of a mass spectrometer, comprising:
Dependencies are inferred from the claim text.