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AssigneeIntel Corporation
InventorsMichael RIFANI, Gregory IOVINO, Roman RECHTER, Grant MCFARLAND, Nasser A. KURD, Eric FETZER, Kurt HENINGER, Qinxin YU, Preethi RAMASWAMY, Monib AHMED, Pauline GOITIA, Narasimha LANKA, Mohammad RASHID, Kit Seong WONG
Estimating the term…
Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.
A control apparatus (20) for determining a device-specific supply voltage for a semiconductor device (200), the control apparatus comprising processing circuitry (24) and storage circuitry (26), wherein the control apparatus is configured to:
A method for determining a device-specific supply voltage for a semiconductor device (200), the method comprising:
Dependencies are inferred from the claim text.