Probe card device and fan-out probe thereof

A probe card device, comprising:

• a first guiding board unit and a second guiding board unit that are spaced apart from each other;
• and
• a plurality of fan-out probes passing through the first guiding board unit and the second guiding board unit, wherein each of the fan-out probes includes:
• a stroke segment being in a straight shape and defining a longitudinal direction, wherein the stroke segment has two end portions respectively arranged in the first guiding board unit and the second guiding board unit;
• a fan-out segment connected to one of the two end portions of the stroke segment, wherein the fan-out segment protrudes from the first guiding board unit and has a fixing point arranged away from the stroke segment;
• and
• a testing segment connected to another one of the two end portions of the stroke segment, wherein the testing segment protrudes from the second guiding board unit and has an abutting point arranged away from the stroke segment, and wherein the fixing point is spaced apart from the abutting point in a fan-out direction perpendicular to the longitudinal direction by a fan-out distance,
• wherein in any two of the fan-out probes adjacent to each other, a distance between the two fixing points is larger than a distance between the two abutting points, and wherein when the first guiding board unit and the second guiding board unit are diagonally staggered with each other, the stroke segments of the fan-out probes are bent toward the same side through the first guiding board unit and the second guiding board unit.