Machine learning device, machining program generation device, and machine learning method
AssigneeMitsubishi Electric Corporation
InventorsSusumu MATSUBARA, Kenji IRIGUCHI, Hiroki KANEKO
Life of this patent
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Abstract
A machine learning device includes: a data extraction unit that extracts a first parameter and a second parameter from each of a plurality of machining programs for numerically controlling a machine tool, the first parameter being a parameter to be adjusted, the second parameter being a parameter to be used for adjusting the parameter to be adjusted; and a machine learning unit that learns a value of the first parameter according to a data set including the first parameter and the second parameter extracted by the data extraction unit.
Claims7
A machine learning device comprising:
- a first processor;
- and
- a first memory to store a first program which, when executed by the first processor, performs processes of:
- extracting a first parameter and a second parameter from each of a plurality of machining programs for numerically controlling a machine tool, the first parameter being a parameter to be adjusted, the second parameter being a parameter to be used for adjusting the parameter to be adjusted;
- and
- machine learning a value of the first parameter according to a data set including the first parameter and the second parameter extracted.
A machine learning method for a machine learning device, the machine learning method comprising:
- extracting a first parameter and a second parameter from each of a plurality of machining programs for numerically controlling a machine tool, the first parameter being a parameter to be adjusted, the second parameter being a parameter to be used for adjusting the parameter to be adjusted;
- and
- learning a value of the first parameter according to a data set including the first parameter and the second parameter extracted.
Dependencies are inferred from the claim text.