Quantum-dot-based measuring system and method
AssigneeShanghai University
InventorsNa CHEN, Shaoying LI, Tingyun WANG, Zhenyi CHEN, Shupeng Liu
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Abstract
A quantum-dot-based measuring system is disclosed. The quantum-dot-based measuring system includes a laser to emit excitation light, an optical fiber probe including a tail end and a tapered tip, and the tapered tip of the optical fiber probe is attached with one or more quantum dots, and the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip to a sample to be detected, an objective lens to collect optical signal reflected by the sample and a spectrometer to receive the optical signal.
Claims15
A quantum-dot-based measuring system comprising,
- a laser to emit excitation light;
- an optical fiber probe including a tail end and a tapered tip, wherein the tapered tip of the optical fiber probe is attached with one or more quantum dots, and wherein the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip to a sample to be detected,
- an objective lens to collect optical signal reflected by the sample;
- and
- a spectrometer to receive the optical signal.
A quantum-dot-based measuring method comprising,
- emitting excitation light from a laser;
- injecting the excitation light through an optical fiber probe to a sample to be detected, wherein the optical fiber probe includes a tail end and a tapered tip, and the tapered tip of the optical fiber probe is attached with one or more quantum dots, and wherein the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip;
- collecting optical signal reflected by the sample at an objective lens;
- and
- receiving the optical signal at a spectrometer.
Dependencies are inferred from the claim text.