Post-processing method to extend the functional range of optical backscatter reflectometry in extreme environments
AssigneeUT-Battelle, LLC
InventorsDaniel C. Sweeney, Christian M. Petrie, Adrian M. Schrell
Life of this patent
Estimating the term…
Loading patent…
AssigneeUT-Battelle, LLC
InventorsDaniel C. Sweeney, Christian M. Petrie, Adrian M. Schrell
Estimating the term…
A system and method for determining an object characteristic from a timed sequence of measured characteristics wherein the object characteristic is determined based on a comparison of a current measured characteristic against a variable reference characteristic. The variable reference characteristic is selected by iterating through the timed sequenced and determining a separate quality metric for the current measured characteristic against each earlier measured characteristic and selecting the variable reference as a function of the determined quality metrics. In one embodiment, iteration continues only until an earlier measured characteristics is found with a quality metric that meets or exceeds a threshold value. In another embodiment, iteration continues through a plurality of earlier measured characteristic (perhaps all) and the variable reference is selected as the earlier measured characteristic with the highest quality metric. The measured characteristics may include OFDR measurements.
A system comprising:
A method for post-processing a timed sequence of measured characteristics of a physical medium to obtain an object characteristic, comprising the steps of:
A system for determining an object characteristic of a physical media from a timed sequence of measured characteristics of the physical medium, comprising:
Dependencies are inferred from the claim text.