# US 2021/0333321 A1 · Systems and methods for parametric testing > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2021/0333321 A1 - Document ID: US20210333321A1 - Status: Published application - Kind: A1 - Application number: 17/241,871 - Filed: 2021-04-27 - Published: 2021-10-28 - Earliest claimed: 2020-04-28 - Assignees: Reedholm Systems Corporation - Applicants: Reedholm Systems Corporation - Inventors: James R. Reedholm; John M. Fluke, JR.; Simon M. Black; Greg J. Petter - Web page: https://patentgrep.com/patent/US20210333321A1 ## CPC - G01R 31/2884: {using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/2855 takes precedence)} - G01R 31/2889: {Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract An illustrative parametric testing system includes a motherboard disposable over a wafer prober chuck. First electrical connectors are disposed on and electrically connected to the motherboard. At least one parametric testing cards is disposable in physical and electrical contact with an associated one of the first electrical connectors proximal a pad of a device under test. The parametric testing card includes electronic circuitry configured to receive a digital signal indicative of test plan instructions, generate an analog stimulus signal for a device under test responsive to the test plan instructions, perform an analog measurement of a stimulated device under test, and transmit a digital signal indicative of the measurement of a device under test. The system includes an interface to a computing system. The interface is electrically connectable to the motherboard. The system includes at least one power supply electrically connectable to the motherboard. ## Claims ### Claim 1 A parametric testing card comprising: a printed circuit board disposable over a chuck of a silicon wafer prober and proximal a probe for a pad of a device under test; a plurality of electrical connectors disposed on the printed circuit board; and electronic circuitry disposed on the printed circuit board and electrically connected to the plurality of electrical connectors, the electronic circuitry being configured to receive a digital signal indicative of test plan instructions, the electronic circuitry being further configured to generate an analog stimulus signal for a device under test responsive to the test plan instructions, the electronic circuitry being further configured to perform an analog measurement of a stimulated device under test, the electronic circuitry being further configured to transmit a digital signal indicative of the measurement of a device under test. ### Claim 2 (depends on 1) The parametric testing card of claim 1, wherein the plurality of electrical connectors includes a plurality of edge connectors. ### Claim 3 (depends on 1) The parametric testing card of claim 1, wherein each of the plurality of edge connectors is configured to be receivable in an associated zero-insertion-force connector. ### Claim 4 (depends on 1) The parametric testing card of claim 1, wherein the electronic circuitry includes at least one electronic circuit chosen from a digital-to-analog converter circuit, a signal generator circuit, a pulse generator circuit, a source measurement circuit, a capacitance measurement circuit, a switching circuit, an analog-to-digital converter circuit, and a digital data transceiver circuit. ### Claim 5 (depends on 4) The parametric testing card of claim 4, wherein the at least one electronic circuit includes at least one integrated circuit disposed on the printed circuit board. ### Claim 6 A parametric testing system comprising: a motherboard disposable over a chuck of a silicon wafer prober; a plurality of first electrical connectors disposed on the motherboard and electrically connected to the motherboard; at least one parametric testing card, each parametric testing card being disposable in physical and electrical contact with an associated one of the plurality of first electrical connectors proximal a probe for a pad of a device under test, each parametric testing card including electronic circuitry configured to receive a digital signal indicative of test plan instructions, the electronic circuitry being further configured to generate an analog stimulus signal for a device under test responsive to the test plan instructions, the electronic circuitry being further configured to perform an analog measurement of a stimulated device under test, the electronic circuitry being further configured to transmit a digital signal indicative of the measurement of a device under test; an interface to a computing system, the interface being electrically connectable to the motherboard; and at least one power supply electrically connectable to the motherboard. ### Claim 7 (depends on 6) The parametric testing system of claim 6, wherein the plurality of first electrical connectors includes a plurality of zero-insertion-force connectors. ### Claim 8 (depends on 6) The parametric testing system of claim 6, wherein the motherboard is configured to electrically connect ones of the plurality of first electrical connectors with a probe associated with a device under test. ### Claim 9 (depends on 6) The parametric testing system of claim 6, wherein each parametric testing card includes: a printed circuit board, the electronic circuitry being disposed on the printed circuit board; and a plurality of second electrical connectors disposed on the printed circuit board, the plurality of second electrical connectors being disposable in physical and electrical contact with an associated one of the plurality of first electrical connectors disposed on the motherboard. ### Claim 10 (depends on 9) The parametric testing system of claim 9, wherein the electronic circuitry includes at least one electronic circuit chosen from a digital-to-analog converter circuit, a signal generator circuit, a pulse generator circuit, a source measurement circuit, a capacitance measurement circuit, a frequency counter circuit, a switching circuit, an analog-to-digital converter circuit, and a digital data transceiver circuit. ### Claim 11 (depends on 10) The parametric testing system of claim 10, wherein the at least one electronic circuit includes at least one integrated circuit disposed on the printed circuit board. ### Claim 12 (depends on 6) The parametric testing system of claim 6, further comprising an extender board disposable in physical and electrical contact with an associated one of the plurality of first electrical connectors, the extender board being configured to electrically connect the at least one power supply with the motherboard and to connect the interface with the motherboard. ### Claim 13 (depends on 6) The parametric testing system of claim 6, further comprising a computing system operatively couplable to the interface. ### Claim 14 A method comprising: disposing a parametric testing system over a chuck of a silicon wafer prober; establishing electrical contact between the parametric testing system and at least a first pad of an associated device under test of a silicon wafer; providing to a first pad of the device under test an analog stimulus signal from a first testing card disposed proximal the first pad; measuring a resultant analog parameter from the first pad of the stimulated device under test by the first testing card; and transmitting a digital signal indicative of the measured resultant analog parameter. ### Claim 15 (depends on 14) The method of claim 14, wherein disposing a parametric testing system over a chuck of a silicon wafer prober includes: inserting at least the first testing card in at least a first electrical connector on a motherboard; attaching a probe card to the motherboard; and mounting the motherboard over the chuck of the silicon wafer prober. ### Claim 16 (depends on 15) The method of claim 15, wherein establishing electrical contact between the parametric testing system and at least a first pad of an associated device under test of a silicon wafer includes disposing a first probe tip of the probe card and the first pad in physical and electrical contact with each other. ### Claim 17 (depends on 14) The method of claim 14, further comprising: receiving a digital signal indicative of test plan instructions; and generating the analog stimulus signal responsive to the test plan instructions. ### Claim 18 (depends on 17) The method of claim 17, further comprising translating test plan instructions from a format for a legacy testing system to a format for the parametric testing system. ### Claim 19 (depends on 14) The method of claim 14, wherein the resultant analog parameter includes at least one parameter chosen from voltage, current, capacitance, and frequency. ### Claim 20 (depends on 14) The method of claim 14, wherein transmitting a digital signal indicative of the measured resultant analog parameter includes providing the digital signal indicative of the measured resultant analog parameter to a computing system via a computer interface.