High resolution multi-pass optical spectrum analyzer
AssigneeViavi Solutions Inc.
InventorsDriss TOUAHRI, Christopher Russell Wagner
Life of this patent
Estimating the term…
Abstract
A system for a high resolution optical spectrum analyzer (OSA) using an efficient multi-pass configuration is disclosed. The system may include an entrance slit to allow inward passage of an optical beam. The system may also include a grating element to diffract the optical beam. The system may further include a retroreflective element to retroreflect the optical beam. The system may also include a mirror to reflect the optical beam. The system may include an exit slit, which in some examples may be adjacent to the entrance slit. The exit slit may allow outward passage of the optical beam for a high resolution optical measurement.
Claims20
A system, comprising:
- an entrance slit to allow inward passage of an optical beam;
- a grating element to diffract the optical beam;
- a retroreflective element to retroreflect the optical beam;
- a mirror to reflect the optical beam;
- and
- an exit slit, adjacent to the entrance slit, to allow outward passage of the optical beam for a high resolution optical measurement.
A method for providing a configuration for high resolution optical measurement, comprising:
- providing an entrance slit to allow inward passage of an optical beam;
- diffracting the optical beam using a grating element;
- retroreflecting the optical beam using a retroreflective element;
- reflecting the optical beam using a mirror;
- and
- providing an exit slit, adjacent to the entrance slit, to allow outward passage of the optical beam for high resolution optical measurement.
A non-transitory computer-readable storage medium having an executable stored thereon, which when executed instructs a processor to perform a method as follows:
- allow inward passage of an optical beam through an entrance slit;
- provide a grating element to diffract the optical beam;
- position a retroreflective element to retroreflect the optical beam;
- provide a mirror to reflect the optical beam;
- and
- provide an exit slit, within 1 millimeter of the entrance slit, to allow outward passage of the optical beam for high resolution optical measurement.
Dependencies are inferred from the claim text.