Secondary monitoring system for a machine under test

A testing system for monitoring a machine under test, the testing system comprising:

• plurality of sensors configured to collect data representing an operating parameter of the machine, wherein the plurality of sensors include one or more high frequency sensors configured to generate a sensor signal that is representative of an operating parameter of the machine, wherein the high frequency sensors have a required high frequency sampling rate;
• a notification device configured to generate a notification indicating the operating parameter monitored by the high frequency sensors has exceeded a predefined threshold value;
• a data acquisition control module configured to monitor the plurality of sensors at a first sampling rate;
• and
• a monitoring control module in electronic communication with the notification device, the monitoring control module configured to monitor the high frequency sensors at a second sampling rate that is greater than the first sampling rate and at least equal to the required high frequency sampling rate, wherein the monitoring control module is caused to:
• determine a maximum value of the sensor signal over a predefined time interval;
• compare the maximum value of the sensor signal with the predefined threshold value;
• determine the maximum value of the sensor signal exceeds the predefined threshold value;
• and
• in response to determining the maximum value of the sensor signal exceeds the predefined threshold value, instruct the notification device to generate the notification.