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US 2021/0293716 A1Published application
Docking station with waveguide enhanced analyte detection strip
AssigneeStrike Photonics, Inc.
InventorDANIEL CAROTHERS
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Abstract
This disclosure presents a docking station into which a test card can be inserted for rapid analyte detection and reporting. This docking station has portable capability and can include wire or wireless transmission to a local server or cloud-based server. A test card that has a test structure located on the test structure that includes a modified waveguide can be inserted into the and a docking station that includes a laser and interferometer provides for accurate and rapid detection of a test sample.
Claims20
A test apparatus, comprising:
- a mounting substrate;
- an uncladded optical waveguide sensor having an uppermost surface and side surfaces formed on a first substrate and located on the mounting substrate, wherein the first substrate comprises a semiconductor material;
- nanoparticles located on or adjacent the uncladded optical waveguide sensor, wherein a concentration of the nanoparticles is higher on or adjacent the side surfaces of the optical waveguide than on the uppermost surface;
- a microfluidic channel having an opening therein and located on the first substrate, such that an analyte, when deposited into the opening, comes into contact with the uncladded optical waveguide sensor;
- and
- a second substrate having optical fibers located thereon located adjacent the first substrate that are optically coupled to the uncladded optical waveguide sensor and extend to a coupling end of the mounting substrate.
3 more elements
A test apparatus, comprising:
- a test card substrate, comprising:
- an uncladded optical waveguide sensor having an uppermost surface and side surfaces formed on a first substrate and located on the test card substrate, wherein the first substrate comprises a semiconductor material;
- nanoparticles located on or adjacent the uncladded optical waveguide sensor, wherein a concentration of the nanoparticles is higher on or adjacent the side surfaces of the uncladded optical waveguide sensor than on the uppermost surface;
- a microfluidic channel having an opening therein and located on the first substrate, such that an analyte, when deposited into the opening, comes into contact with the uncladded optical waveguide sensor;
- and
- a second substrate having optical fibers located thereon that are optically coupled to the uncladded optical waveguide sensor and extend to a coupling end of test card substrate;
- and
- a docking station for receiving the coupling end of the test card substrate therein, comprising:
- a housing having a test card interface that is configured to receive the test card therein;
- a laser located within the housing and optically aligned with the test structure to receive a transmission therefrom;
- an integrated spectrometer located within the housing and optically couplable to the test structure to receive an optical transmission therefrom;
- and
- a data processor and control board located within the housing, the control board configured to control an operation of the laser, interferometer, and data processor and being operatively coupled thereto.
10 more elements
Dependencies are inferred from the claim text.