Sampling apparatus for detecting a starting byte in a high-frequency serial data stream
AssigneeFraba B.V.
InventorsUWE KETTERING, MATTHIAS LANSING
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Abstract
A scanning apparatus for detecting a start byte in a high-frequency serial data stream. The scanning apparatus includes a detection unit and a clock signal generator. The detection unit detects the start byte in the high-frequency serial data stream. The detection unit only includes an independent logic detection circuit which only includes temperature-insensitive circuit elements and which excludes addition blocks. The clock signal generator provides the detection unit with a high-frequency clock signal which is synchronized to the high-frequency serial data stream. The high-frequency clock signal is provided with a frequency which is higher than a frequency of the high-frequency serial data stream.
Claims7
1-6. (canceled)
7:
- A scanning apparatus for detecting a start byte in a high-frequency serial data stream, the scanning apparatus comprising:
- a detection unit which is configured to detect the start byte in the high-frequency serial data stream, the detection unit consisting of an independent logic detection circuit which consists of temperature-insensitive circuit elements and which excludes addition blocks;
- and
- a clock signal generator which is configured to provide the detection unit with a high-frequency clock signal which is synchronized to the high-frequency serial data stream, the high-frequency clock signal being provided with a frequency which is higher than a frequency of the high-frequency serial data stream.
8:
- The scanning apparatus as recited in claim 7, wherein the clock signal generator is provided as a microcontroller.
9:
- The scanning apparatus as recited in claim 7, wherein the independent logic detection circuit of the detection unit is provided as an integrated circuit.
10:
- The scanning apparatus as recited in claim 7, wherein the detection unit is configured to provide the clock signal generator with a feedback clock signal.
11:
- The scanning apparatus as recited in claim 7, wherein the temperature-insensitive circuit elements are provided as a shifting register element which comprises n memory locations and a plurality of lookup table elements.
12:
- The scanning apparatus as recited in claim 11, wherein the plurality of lookup table elements are configured so that a maximum of n−1 of the n memory locations of the shifting register element are evaluable.