# US 2021/0278451 A1 · Fault detection device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2021/0278451 A1 - Document ID: US20210278451A1 - Status: Published application - Kind: A1 - Application number: 17/329,902 - Filed: 2021-05-25 - Published: 2021-09-09 - Earliest claimed: 2018-11-29 - Assignees: Denso Corporation - Applicants: Denso Corporation - Inventors: Bunsei MURAKAMI - Web page: https://patentgrep.com/patent/US20210278451A1 ## CPC - G01R 29/10: Radiation diagrams of antennas - H04B 17/0085: {using test signal generators} - H04B 1/3822: specially adapted for use in vehicles (H04B1/3827 takes precedence) - H04B 17/16: Test equipment located at the transmitter - H04B 17/17: Detection of non-compliance or faulty performance, e.g. response deviations (H04B17/18 takes precedence) - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H04B: TRANSMISSION ## Abstract A fault detection device executes a test signal supply process for changing a frequency of a carrier wave within a frequency range predetermined as a range of a resonance frequency of an antenna, modulating the carrier wave with a test signal as an input signal, amplifying the carrier wave that is modulated, and supplying the carrier wave that is amplified as an output target signal to the antenna. While executing the test signal supply process, the fault detection device measures an antenna current corresponding to the frequency each time the frequency of the carrier wave is changed The fault detection device detects a fault caused by a difference or a change in a characteristic of the antenna by using a value of the antenna current on a larger side among the antenna currents measured during the test signal supply process. ## Claims ### Claim 1 A fault detection device for detecting a fault of an antenna, comprising: a frequency adjuster configured to adjust a frequency of a carrier wave; a modulator configured to modulate the carrier wave with an input signal; an amplifier configured to amplify the input signal that is modulated to generate an output target signal and supply the output target signal to the antenna; a current measurer configured to measure an antenna current that flows through the antenna; a fault detector configured to detect the fault; and a controller, wherein while the controller executes a test signal supply process in which the controller controls the frequency adjuster to change the frequency of the carrier wave within a frequency range predetermined as a range of a resonance frequency of the antenna, controls the modulator to modulate the carrier wave with a test signal as the input signal, and controls the amplifier to amplify the carrier wave that is modulated and supply the carrier wave that is amplified as the output target signal to the antenna, the controller controls the current measurer to measure the antenna current corresponding to the frequency each time the frequency of the carrier wave is changed, and the fault detector detects the fault caused by a difference or a change in a characteristic of the antenna by using a value of the antenna current on a larger side among the antenna currents measured during execution of the test signal supply process. ### Claim 2 (depends on 1) The fault detection device according to claim 1, wherein the fault detector detects the fault that the antenna having the characteristic different from the characteristic of a correct antenna is assembled when the frequency corresponding to a maximum value of the antenna current measured during execution of the test signal supply process is out of a range of a frequency band corresponding to a current value assumed in a case where the test signal supply process is executed in a state where the correct antenna is assembled. ### Claim 3 (depends on 1) The fault detection device according to claim 1, wherein the controller repeatedly executes the test signal supply process and measurement of the antenna current corresponding to the frequency for each frequency of the carrier wave, and the fault detector detects the fault that the characteristic of the antenna changes when a frequency difference, which is a difference between the frequency corresponding to a maximum value of the antenna current measured during execution of the test signal supply process in a current cycle and the frequency corresponding to a maximum value of the antenna current measured during execution of the test signal supply process in previous cycle, is equal to or greater than a predetermined threshold value. ### Claim 4 (depends on 1) The fault detection device according to claim 1, wherein in the test signal supply process, the controller performs either one of increase or decrease of the frequency within the frequency range in order from an initial value predetermined as a usage frequency, and when the frequency reaches a critical value in the frequency range, the controller performs the other of increase or decrease in the frequency range from the initial value to another critical value in the frequency range. ### Claim 5 (depends on 4) The fault detection device according to claim 4, further comprising a storage configured to store a value of the antenna current measured for each frequency of the carrier wave in the test signal supply process, wherein the fault detector is configured to detect the fault by referring to the value of the antenna current stored in the storage in the test signal supply process. ### Claim 6 (depends on 1) The fault detection device according to claim 1, further comprising a notification controller configured to control a notifier to notify the detection of the fault when the fault is detected. ### Claim 7 (depends on 1) The fault detection device according to claim 1, wherein the frequency of the carrier wave is a frequency in a low frequency band. ### Claim 8 A fault detection device for detecting a fault of an antenna, comprising: a central processing unit (CPU) configured to detect the fault; and an integrated circuit (IC) configured to: adjust a frequency of a carrier wave; modulate the carrier wave with an input signal; amplify the input signal that is modulated to generate an output target signal and supply the output target signal to the antenna; and measure an antenna current that flows through the antenna, wherein while the IC executes a test signal supply process for changing the frequency of the carrier wave within a frequency range predetermined as a range of a resonance frequency of the antenna, modulating the carrier wave with a test signal as the input signal, amplifying the carrier wave that is modulated, and supplying the carrier wave that is amplified as the output target signal to the antenna, the IC measures the antenna current corresponding to the frequency each time the frequency of the carrier wave is changed, and the CPU detects the fault caused by a difference or a change in a characteristic of the antenna by using a value of the antenna current on a larger side among the antenna currents measured during execution of the test signal supply process. ### Claim 9 A fault detection device comprising a processor and a memory, the memory storing instructions configured to, when executed by the processor, cause the processor to: execute a test signal supply process for changing a frequency of a carrier wave within a frequency range predetermined as a range of a resonance frequency of an antenna, modulating the carrier wave with a test signal as an input signal, amplifying the carrier wave that is modulated, and supplying the carrier wave that is amplified as an output target signal to the antenna; measure an antenna current corresponding to the frequency each time the frequency of the carrier wave is changed while executing the test signal supply process, the antenna current being an electric current that flows through the antenna; and detect a fault caused by a difference or a change in a characteristic of the antenna by using a value of the antenna current on a larger side among the antenna currents measured during execution of the test signal supply process.