# US 2021/0278440 A1 · Electronic test device

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- Number: US 2021/0278440 A1
- Document ID: US20210278440A1
- Status: Published application
- Kind: A1
- Application number: 16/808,793
- Filed: 2020-03-04
- Published: 2021-09-09
- Earliest claimed: 2020-03-04
- Assignees: Winway Technology Co., Ltd.
- Applicants: Winway Technology Co., Ltd.
- Inventors: Kuan-Chung CHEN; Cheng-Hui LIN; Kuan-Yu CHEN
- Web page: https://patentgrep.com/patent/US20210278440A1

## CPC

- G01R 1/07314: {the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735)}
- G01R 1/07371: {using an intermediate card or back card with apertures through which the probes pass}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

An electronic test device includes a test seat and at least one probe. The test seat has a hole-defining surface that defines a probe hole, and has two positioning sections being proximate respectively to two ends of the probe hole opposite to each other, at least one first protrusion that protrudes inwardly from the at least one positioning sections of the hole-defining surface, and at least one second protrusion that protrudes inwardly from the hole-defining surface between the positioning sections. The at least one probe is positioned in the probe hole. A thickness of each of the at least one first protrusion and the at least one second protrusion ranges from five to thirty percent of a depth of the probe hole.

## Claims

### Claim 1

An electronic test device comprising:
a test seat that has
at least one seat wall having
a hole-defining surface that defines a probe hole extending in a longitudinal direction, and that has two positioning sections being proximate respectively to two ends of said probe hole which are opposite to each other in the longitudinal direction,
at least one first protrusion that protrudes inwardly from at least one of said positioning sections of said hole-defining surface, and
at least one second protrusion that protrudes inwardly from said hole-defining surface and that is disposed between said positioning sections; and
at least one probe that is positioned in said probe hole;
wherein a thickness of each of said at least one first protrusion and said at least one second protrusion in the longitudinal direction ranges from five to thirty percent of a depth of said probe hole.

### Claim 2 (depends on 1)

The electronic test device as claimed in claim 1, wherein:
said at least one probe includes a main body and two contact members connected to opposite ends of said main body in the longitudinal direction;
at least one of said contact members is registered with said at least one first protrusion in a transverse direction which is perpendicular to the longitudinal direction; and
said main body is registered with said at least one second protrusion in the transverse direction.

### Claim 3 (depends on 2)

The electronic test device as claimed in claim 2, further comprising at least one positioning unit including at least one insulator that is disposed in said probe hole, that covers said at least one first protrusion, and that surrounds said at least one probe.

### Claim 4 (depends on 1)

The electronic test device as claimed in claim 1, wherein the thickness of said at least one second protrusion is greater than the thickness of said at least one first protrusion.

### Claim 5 (depends on 1)

The electronic test device as claimed in claim 1, wherein:
said at least one second protrusion of said at least one seat wall is ring-shaped and surrounds said at least one probe; and
a cross section of said at least one second protrusion which is parallel to the longitudinal direction is a rectangle.

### Claim 6 (depends on 5)

The electronic test device as claimed in claim 5, wherein an inner diameter of said at least one second protrusion ranges from forty to eighty percent of a maximum diameter of said at least one probe hole.

### Claim 7 (depends on 1)

The electronic test device as claimed in claim 1, wherein:
said at least one second protrusion is ring-shaped and surrounds said at least one probe; and
a cross section of said at least one second protrusion which is parallel to the longitudinal direction is one of a triangle and a trapezoid.

### Claim 8 (depends on 7)

The electronic test device as claimed in claim 7, wherein a minimum inner diameter of said at least one second protrusion ranges from forty to eighty percent of a maximum diameter of said at least one probe hole.

### Claim 9 (depends on 1)

The electronic test device as claimed in claim 1, wherein said at least one second protrusion includes two second protrusions being spaced apart in the longitudinal direction.