Device for emulating a bimetallic strip, and device for protecting an electrical line from over-currents
AssigneeThales
InventorFrancis ABDESSELAM
Life of this patent
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AssigneeThales
InventorFrancis ABDESSELAM
Estimating the term…
The invention relates to an emulating device (EMU) for emulating a bimetallic strip, the emulating device (EMU) comprising a current sensor (CC) capable of measuring a line current (IP) flowing through the emulating device (EMU), the emulating device (EMU) being capable of providing a value representative of a cumulative thermal state (Eth_n) over time t, which value is referred to as cumulative thermal state (Eth_n), by recursively adding a value representative of an initial thermal state (Eth_i), which value is referred to as initial thermal state (Eth_i), and a value representative of a present thermal state (Eth_on, Eth_off), which value is referred to as present thermal state (Eth_on, Eth_off), which is determined on the basis of the line current (IP).
An emulating device (EMU) for emulating a bimetallic strip, the emulating device (EMU) comprising a current sensor (CC) capable of measuring a line current (IP) flowing through the emulating device (EMU), the emulating device (EMU) being capable of providing a value representative of a cumulative thermal state (Eth_n) over time t, which value is referred to as cumulative thermal state (Eth_n), by recursively adding a value representative of an initial thermal state (Eth_i), which value is referred to as initial thermal state (Eth_i), and a value representative of a present thermal state (Eth_on, Eth_off), which value is referred to as present thermal state (Eth_on, Eth_off), which is determined on the basis of the line current (IP).
A protective device (PRO) for protecting an electrical line (LIG) from overcurrents of the line current (IP), wherein the protective device (PRO) comprises:
Dependencies are inferred from the claim text.