Back to results
US 2021/0265339 A1Published application
Semiconductor device and manufacturing method thereof
AssigneeInnoscience (Zhuhai) Technology Co., Ltd.
InventorsQiyue ZHAO, Chuan HE
Life of this patent
Estimating the term…
Abstract
Some embodiments of the disclosure provide a semiconductor device. The semiconductor device includes: a doped substrate; a barrier layer, disposed on the doped substrate; a channel layer, disposed between the doped substrate and the barrier layer; and a doped semiconductor structure, disposed in the doped substrate, where a band gap of the barrier layer is greater than a band gap of the channel layer, and the doped substrate and the doped semiconductor structure have different polarities.
Claims21
A semiconductor device, comprising:
- a doped substrate;
- a barrier layer, disposed on the doped substrate;
- a channel layer, disposed between the doped substrate and the barrier layer;
- and
- a doped semiconductor structure, disposed in the doped substrate, wherein
- a band gap of the barrier layer is greater than a band gap of the channel layer, and
- the doped substrate and the doped semiconductor structure have different polarities.
4 more elements
A semiconductor device, comprising:
- a substrate;
- a high-electron-mobility transistor (HEMT), disposed on the substrate;
- a diode, disposed in the substrate;
- and
- a conductor layer, disposed below the substrate.
2 more elements
Dependencies are inferred from the claim text.