Semiconductor device, sintered metal sheet, and method for manufacturing sintered metal sheet
AssigneeHitachi, Ltd.
InventorsTomohisa SUZUKI, Hiroshi MORIYA
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AssigneeHitachi, Ltd.
InventorsTomohisa SUZUKI, Hiroshi MORIYA
Estimating the term…
A method utilized at a sintered metal layer bonding a semiconductor element and a support substrate together suppresses cracks appearing in the sintered metal layer, and damage to the semiconductor element. A semiconductor device includes a support substrate, a semiconductor element, and a sintered metal layer bonding the support substrate and the semiconductor element. The sintered metal layer has a low porosity region disposed inward of an outer edge of the semiconductor element with the sintered metal layer bonded to the semiconductor element. The region is lower in porosity than the remaining sintered metal layer, and is formed as a wall-shaped structural body having an elongated string and extending from an upper surface to a lower surface of the sintered metal layer. The low porosity region is disposed to surround a region immediately below a center of the semiconductor element along the outer edge of the semiconductor element.
A semiconductor device comprising:
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A sintered metal sheet to be interposed between a semiconductor element and a support substrate to bond the semiconductor element and the support substrate together,
A method for manufacturing a sintered metal sheet,
The method according to claim 640, wherein
Dependencies are inferred from the claim text.