Integrated circuit with self-test circuit, method for operating an integrated circuit with self-test circuit, multi-core processor device and method for operating a multi-core processor device

An integrated circuit with self-test circuit, comprising:

• at least one logic circuit;
• at least one input storage element for storing work data;
• at least one output storage element;
• at least one input test storage element for storing test data;
• and
• at least one output test storage element;
• wherein the logic circuit is selectively connected to the input storage element on an input side of the logic circuit, such that the input storage element provides the work data to the logic circuit in a work mode, or
• is selectively connected to the input test storage element on the input side of the logic circuit, such that the input test storage element provides the test data to the logic circuit in a test mode;
• wherein the logic circuit is furthermore connected or selectively connected to the output storage element and the output test storage element on an output side of the logic circuit, such that the logic circuit feeds data to the output storage element and/or to the output test storage element;
• wherein the output storage element is configured to process the data from the logic circuit if the work data are provided to the logic circuit in the work mode, and not to process the data from the logic circuit if the test data are provided to the logic circuit in the test mode.