Noise Parameter Determination of Scalable Devices
AssigneeThe Government of the United States of America, as represented by the Secretary of the Navy
InventorLuciano Boglione
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Abstract
A method to determine noise parameters of a scalable device, is presented in which the determination of the noise parameters of the scalable device is independent of the model adopted for the device. The scalable device is connected as part of a test circuit including a noise source, a recirculator, a first power detector and a second power detector. The first power detector is connected to the recirculator and between the noise source and the scalable device and the second detector is connected to the device under test.
Claims7
A method to determine noise parameters of a scalable device,
- wherein the determination of the noise parameters of the scalable device is independent of model adopted for the device.
Dependencies are inferred from the claim text.