Electromagnetic wave measurement probe, electromagnetic wave measurement system, and bundled optical fiber

Abstract

A measurement probe used in an electromagnetic wave measurement system is provided. The measurement probe includes a first measurement device and a second measurement device. The first measurement device includes a first electro-optic crystal that exhibits an electro-optic effect, a first optical fiber that is provided on a root side of the first electro-optic crystal and transmits an optical signal, and a first reflector that is provided on a tip side of the first electro-optic crystal and reflects the optical signal. The second measurement device includes a second electro-optic crystal, a second optical fiber, and a second reflector. The first and second electro-optic crystals form one electro-optic crystal, and the first and second optical fibers are connected to a root side of the one electro-optic crystal.

Dependencies are inferred from the claim text.