System and method for analyzing an electronic device
AssigneeRohde & Schwarz GmbH & Co. KG
InventorSam CHEW
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Abstract
The invention relates to a system for analyzing an electronic device, comprising: a signal generator configured to generate at least one composite signal within a test frequency range, wherein the composite signal comprises a plurality of narrowband signals, each narrowband signal having a center frequency within a subrange of the test frequency range, a transmitter configured to transmit said composite signal to the electronic device, and an analyzing unit configured to analyze a response of the electronic device to the composite signal.
Claims18
A system for analyzing an electronic device, comprising:
- a signal generator configured to generate at least one composite signal within a test frequency range, wherein the composite signal comprises a plurality of narrowband signals, each narrowband signal having a center frequency within a subrange of the test frequency range,
- a transmitter configured to transmit said composite signal to the electronic device, and
- an analyzing unit configured to analyze a response of the electronic device to the composite signal.
A method for analyzing an electronic device, comprising:
- setting a test frequency range for testing the electronic device;
- generating at least one composite signal, wherein the composite signal comprises a plurality of narrowband signals, each narrowband signal having a center frequency within a subrange of the test frequency range;
- transmitting said composite signal to the electronic device;
- and
- analyzing a response of the electronic device to the composite signal.
Dependencies are inferred from the claim text.