# US 2021/0239596 A1 · Particle analysis using light microscope and multi-pixel polarization filter > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2021/0239596 A1 - Document ID: US20210239596A1 - Status: Published application - Kind: A1 - Application number: 17/158,572 - Filed: 2021-01-26 - Published: 2021-08-05 - Earliest claimed: 2020-01-31 - Assignees: Carl Zeiss Microscopy GmbH - Applicants: Carl Zeiss Microscopy GmbH - Inventors: Indrajati Nicole KASTANJA; Markus CAPPELLARO; Achim SCHWARZ - Web page: https://patentgrep.com/patent/US20210239596A1 ## CPC - G01N 15/1433: using image recognition - G02B 21/367: {providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison} - G01N 15/1429: Signal processing - G02B 21/0032: {Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers (G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06)} - G01N 2015/1493: {Particle size} - G01N 2015/1497: {Particle shape} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS ## Abstract Techniques in connection with the use of a multi-pixel polarization filter in the light-microscopic examination of a sample object are described. In this way e.g. a particle analysis can be carried out, e.g. in particular for determining the technical cleanness of a surface of the sample object. ## Claims ### Claim 1 An optical system, comprising: a sample holder configured to fix a sample object, a light microscope, which defines an illumination light path and a detection light path for microscopy of the sample object with polarized light, at least one camera comprising a multi-pixel detector having a multiplicity of detector pixel elements, and a multi-pixel polarization filter having a multiplicity of polarization filter pixel elements, wherein the multi-pixel polarization filter is arranged between the sample holder and the multi-pixel detector in the detection light path, wherein the multi-pixel detector is configured to provide image data, and a computer logic element configured to calculate at least one polarization image of the sample object on the basis of the image data, wherein the computer logic element is furthermore configured to carry out a particle analysis for a surface of the sample object on the basis of the at least one polarization image. ### Claim 2 (depends on 1) The optical system according to claim 1, wherein the computer logic element is furthermore configured to determine a coefficient of measure that is indicative of technical cleanness of the surface of the sample object on the basis of the at least one polarization image. ### Claim 3 (depends on 1) The optical system according to claim 1, wherein the computer logic element is configured to interpolate pixel values of the image data in order to obtain an increased resolution for the image data. ### Claim 4 (depends on 1) The optical system according to claim 1, wherein the computer logic element is configured to average neighbouring pixel values of the image data in order to obtain an increased signal-to-noise ratio for the image data. ### Claim 5 (depends on 1) The optical system according to claim 1, wherein the multi-pixel polarization filter comprises at least two groups of polarization filter pixel elements, wherein the polarization filter pixel elements of the at least two groups each filter different polarization directions of light. ### Claim 6 (depends on 5) The optical system according to claim 5, wherein the at least two groups comprise a first group and a second group, wherein the polarization directions filtered by the polarization filter pixel elements of the first group and of the second group form a first basis for the space of the polarization directions, wherein the at least two groups comprise a third group and a fourth group, wherein the polarization directions filtered by the polarization filter pixel elements of the third group and of the fourth group form a second basis for the space of the polarization directions. ### Claim 7 (depends on 6) The optical system according to claim 6, wherein the computer logic element is configured to obtain pixel values of the at least one polarization image by combination of pixel values of the image data which correspond to polarization filter pixel elements of the first basis with pixel values of the image data which correspond to polarization filter pixel elements of the second basis. ### Claim 8 (depends on 7) The optical system according to claim 7, wherein the combination is effected in a weighted fashion. ### Claim 9 (depends on 1) The optical system according to claim 1, wherein the light microscope comprises a polarizer arranged in the illumination light path in order to polarize the light. ### Claim 10 (depends on 1) The optical system according to claim 1, wherein the at least one camera furthermore comprises a multi-pixel spectral filter having a multiplicity of spectral filter pixel elements, which is arranged upstream of the multi-pixel detector in the detection light path. ### Claim 11 (depends on 10) The optical system according to claim 10, wherein the spectral ranges filtered by the multiplicity of spectral filter pixel elements form a superpattern with respect to a pattern formed by the polarization directions filtered by the multiplicity of polarization filter pixel elements. ### Claim 12 A method, comprising: controlling a multi-pixel detector associated with a multi-pixel polarization filter, and receiving image data that microscopically image a sample object by means of the multi-pixel detector, on the basis of the image data: calculating at least one polarization image, of the sample object, and on the basis of the at least one polarization image: carrying out a particle analysis for a surface of the sample object. ### Claim 13 (depends on 12) The method according to claim 12, wherein the method is implemented by the computer logic element of the optical system comprising: a sample holder configured to fix a sample object, a light microscope, which defines an illumination light path and a detection light path for microscopy of the sample object with polarized light, at least one camera comprising a multi-pixel detector having a multiplicity of detector pixel elements, and a multi-pixel polarization filter having a multiplicity of polarization filter pixel elements, wherein the multi-pixel polarization filter is arranged between the sample holder and the multi-pixel detector in the detection light path, wherein the multi-pixel detector is configured to provide image data, and a computer logic element configured to calculate at least one polarization image of the sample object on the basis of the image data, wherein the computer logic element is furthermore configured to carry out a particle analysis for a surface of the sample object on the basis of the at least one polarization image. ### Claim 14 A method of performing light-microscopic examination of a sample object, comprising using a multi-pixel detector having a multiplicity of detector pixel elements, and a multi-pixel polarization filter having a multiplicity of polarization filter pixel elements. ### Claim 15 (depends on 14) The method according to claim 14, further comprising performing a particle analysis of a surface of the sample object.