Data channel aging circuit, memory and aging method

A memory, comprising a data channel aging circuit and an integrated circuit (IC), wherein the data channel aging circuit is configured to perform an aging test on the IC, and wherein the data channel aging circuit comprises:

• a memory cell, storing a voltage switching signal configured to provide a target voltage state for each of a plurality of data channels in the IC;
• a control unit, configured to generate a voltage control signal and to send the voltage control signal to each of the plurality of data channels;
• and
• a strobe unit, configured to switch a conductive state of each of the plurality of data channels based on the voltage switching signal, and to adjust, through the voltage control signal, a voltage level of each of the plurality of data channels to induce voltage stress aging.

A data channel aging method, for performing an aging test on an integrated circuit (IC), the method comprising:

• determining, according to a voltage switching signal, a target voltage state of each of a plurality of data channels in the IC;
• switching, based on the voltage switching signal, a conductive state of each of the plurality of data channels;
• and
• adjusting, through a voltage control signal, a voltage level of the each of the plurality of data channels to induce voltage stress aging.

An aging method for a memory, wherein the memory comprises an integrated circuit (IC) comprising a plurality of data channels, some of the data channels are configured as machine aging data channels, and the rest of the data channels are configured as voltage aging data channels, and wherein the aging method comprises:

• connecting the machine aging data channels to an IC aging machine, the IC aging machine transmitting data to the machine aging data channels;
• determining, according to a voltage switching signal, a target voltage state of each of the voltage aging data channels;
• switching, based on the voltage switching signal, a conductive state of each of the voltage aging data channels;
• and
• adjusting, through a voltage control signal, a voltage level of each of the voltage aging data channels to induce voltage stress aging.