Electronic circuit and corresponding method of testing electronic circuits

A method of testing an electronic circuit, comprising:

• receiving a test input signal at a test input pin of the electronic circuit, wherein the test input signal comprises a sequence of binary values;
• shifting the received test input signal into at least one input register that is active on one of rising edges or falling edges of a clock signal;
• shifting the received test input signal from the at least one input register into a set of scan registers serially coupled to each other to form a scan chain, wherein the set of scan registers are active on the other of rising edges or falling edges of said clock signal;
• and
• sensing a test output signal at a test output pin of the electronic circuit, wherein the test output signal comprises a sequence of binary values shifted out of the set of scan registers forming the scan chain.

An electronic circuit, comprising:

• a combinational circuit block having a set of input pins configured to receive input digital signals and a set of output pins configured to provide output digital signals as a function of the input digital signals received;
• a test input pin configured to receive a test input signal;
• a test output pin configured to provide a test output signal as a function of the test input signal;
• a set of scan registers, wherein the scan registers in the set of scan registers are selectively coupled to either the combinational circuit block or to one another so as to form a scan chain of scan registers serially coupled between the test input pin and the test output pin;
• at least one input register coupled between the test input pin and a first scan register of said scan chain;
• wherein the scan registers in the set of scan registers are active on one of the rising edge or falling edge of said clock signal;
• and
• wherein said at least one input register is active on the other of the rising edge or falling edge of said clock signal.