Abnormality determination support apparatus

An abnormality determination support apparatus that provides determination information for determining whether an abnormality has occurred in a manufacturing facility, comprising:

• at least one processor;
• and
• at least one memory that stores at least one program, the at least one program causing the at least one processor to operate as:
• an analysis object data preparation unit that is configured to acquire a time-series signal representing at least one of a state of the manufacturing facility and a product quality from a data collection apparatus of the manufacturing facility, and extract analysis object data from the time-series signal;
• a primary determination unit that is configured to derive a plurality of primary determination results from common analysis object data by applying a plurality of different types of analysis methods to the analysis object data extracted by the analysis object data preparation unit;
• and
• a secondary determination unit that includes a machine learning device which is learned using a teacher signal which is a pair of a primary determination result obtained by the primary determination unit and a corresponding set of an abnormality determination result and an abnormality cause, which is a correct answer, and is configured to input the plurality of primary determination results obtained from the common analysis object data by the primary determination unit to the machine learning device, and output a secondary determination result and an estimated abnormality cause output from the machine learning device as the determination information.