Sample analysis support apparatus
AssigneeYokogawa Electric Corporation
InventorTakayuki KEI
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Abstract
A sample analysis support apparatus includes a sample region in which a sample is to be disposed, a tip region in which a tip is to be disposed, a first operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the first operation unit, a second operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the second operation unit, a transport unit configured to support each of the first operation unit and the second operation unit moveably between the tip region and the sample region, and a movement controller capable of controlling the transport unit to move each of the first operation unit and the second operation unit between the tip region and the sample region.
Claims10
A sample analysis support apparatus comprising:
- a sample region in which a sample is to be disposed;
- a tip region in which a tip is to be disposed;
- a first operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the first operation unit;
- a second operation unit capable of an operation on the sample using the tip, the tip being attachable to and detachable from the second operation unit;
- a transport unit configured to support each of the first operation unit and the second operation unit moveably between the tip region and the sample region;
- and
- a movement controller capable of controlling the transport unit to move each of the first operation unit and the second operation unit between the tip region and the sample region.
Dependencies are inferred from the claim text.